STE-NIR-InGaAs
NIR InGaAs Spectrometer RED-Wave
StellarNets’ high performance InGaAs spectrometers cover the NIR wavelength range from 0.9-2.3 μm
Optical Test & Measurement
DAT-WinCamD-THz
Mutlispectral THz Camera
Laser Beam Profiler, which is ideally suited for multispectral THz laser beam analysis in the range of 3 THz to 20 THz.
STE-SL1
Halogen Light Source
The SL1 Fiber Optic Light Source for VIS - NIR applications allows one sample per fiber to be illuminated.
STE-SL3
Deuterium Light Source
Die weltweit kleinste, langlebige und hochleistungs-Deuterium-Lichtquelle für CW (continuous wave) Ultraviolet für die Bereiche von 190 - 450nm
DAT-LNZ-FIR-2-16
Infrared Lens Assembly for WinCamD-IR-BB
Lens Assembly transforms Beam Profiler to Infrared Imager.
STE-PORTA-LIBS-2000
Portable low cost analyzer LIBS
Das STE-PORTA-LIBS-2000 ist ein portables, kostengünstiges System für die laserinduzierte Plasmaspektroskopie (LIPS), welche eine schnelle, berührungslose Methode zur Analyse von festen, flüssigen und gasförmigen Stoffen ist.
DAT-WinCamD-QD-2000
Laser Beam Profiler WinCamD-QD-2000
This Laser Beam Profiler from DataRay is equipped with a CQD sensor and offers a spectral response in the SWIR range of 350 - 2000 nm with resolutions up to 1920 x 1080 pixel.
STE-Lichtleitfasern
Fiber optic cables
Lichtleitfasern (Glasfasern) als Zubehör für unsere Spektrometer
Popular Products
DAT-WinCamD-LCM
Laser Beam Profiler WinCamD-LCM
This laser beam profiler features a CMOS sensor that guarantees frame rates of up to 60 Hz with high dynamics and is suitable for large beam diameters up to 11 mm.
DAT-WinCamD-IRBB
2-16 micron Laser Beam Analyzer
The beam analysis camera WinCamD-IR-BB with integrated microbolometer array enables analyzes on long-wave lasers in the range of 2 μm to 16 μm.
DAT-WinCamD-QD-1550
Laser Beam Profiler WinCamD-QD-1550
This Laser Beam Profiler from DataRay is equipped with a CQD sensor and offers a spectral response in the SWIR range of 400 - 1700 nm with resolutions up to 1920 x 1080 pixel.
DataRay's ILM system is used for beam profile monitoring of high power lasers consisting of an attenuator for high powers, an imaging lens system and a camera system. The measurement of very small laser beams with diameters of less than micrometers is possible despite often high laser powers.
