A main feature of the WinCamD is the optional M2 Stage. Thus, it can be easily extended to a complete M2 measurement system.
Laser Beam Profiling and M² measurement
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Laser Beam Profiling and M² measurement
The quality of the radiation is often referred to in material processing and measurement technology. Depending on the application, the quality is determined by the temporal and local stability of the output power, the width of the frequency spectrum, the temporal and local coherence, and the magnitude of the beam divergence, which is related to the extent to which the radiation can be focused.
In combination with the Beam Profiler "WindCamD", the ND filter is used to attenuate or suppress the ambient light.
By means of the described UV converter optics the measurement of the intensity distribution of UV laser radiation with standard Si-based CCD or CMOS cameras is possible.
IR converter optics for Beam Profiler for measuring intensity distribution in the NIR range between 1480 and 1600 nm.
This optical beam reducer to be connected to the C-mount a camera WinCamD-ray analysis is used when the beam diameter of the laser is much greater than the sensor chip or of the taper.
The Polarization Preserving Beam Sampler (PPBS) uses a dual wedge design to sample a small percentage of a beam’s power for laser beam profiling applications.
Lens Assembly transforms Beam Profiler to Infrared Imager.
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This laser beam profiler features a CMOS sensor that guarantees frame rates of up to 60 Hz with high dynamics and is suitable for large beam diameters up to 11 mm.
The beam analysis camera WinCamD-IR-BB with integrated microbolometer array enables analyzes on long-wave lasers in the range of 2 μm to 16 μm.
This Laser Beam Profiler from DataRay is equipped with a CQD sensor and offers a spectral response in the SWIR range of 400 - 1700 nm with resolutions up to 1920 x 1080 pixel.
DataRay's ILM system is used for beam profile monitoring of high power lasers consisting of an attenuator for high powers, an imaging lens system and a camera system. The measurement of very small laser beams with diameters of less than micrometers is possible despite often high laser powers.
