FOV-Vorlauf-x-y-z
Leader fiber for OTDR measurements
Launch Fiber for OTDR applications in various lenght and connector assamblies are available.
Laser 2000 offers a variety of test solutions to meet daily challenges in telecommunications environments. Applications include optical and/or electrical measurements on the transmission medium (such as for optical level measurement technology), OTDRs, WDM, copper certification in the LAN or xDSL environment, end-face connector inspection with microscopes, and bit error and protocol analysis on transmission systems within xDSL, Ethernet, SDH, or OTN environments.
FOV-Vorlauf-x-y-z
Launch Fiber for OTDR applications in various lenght and connector assamblies are available.
FOV-Vorlauffaser-Ring
Lead and lag fibers are used to adapt the meter to the target. The use of a launch fiber protects the adapters on the meter and evaluates the start or end events.
FLK-DSX-8000
DSX2-8000 accelerates every step of the copper certification process
FLK-DSX-5000
FLK-FI-7000
FLK-FI-3000
FLK-OFP-100
FLK-CFP-100
FLK-Versiv-Plattform
Gold Support is the comprehensive support and maintenance program for Fluke Networks products and accessories. Best-in-class support to reduce business downtime and ensure a higher return on investment.
FLK-DSX-PLA004S-PLA804S
FLK-MS-POE
FLK-Gold-Support
Gold Support is the comprehensive support and maintenance program for Fluke Networks products and accessories. Best-in-class support to reduce business downtime and ensure a higher return on investment.
DAT-WinCamD-LCM
This laser beam profiler features a CMOS sensor that guarantees frame rates of up to 60 Hz with high dynamics and is suitable for large beam diameters up to 11 mm.
DAT-WinCamD-IRBB
The beam analysis camera WinCamD-IR-BB with integrated microbolometer array enables analyzes on long-wave lasers in the range of 2 μm to 16 μm.
DAT-WinCamD-QD-1550
DataRay's ILM system is used for beam profile monitoring of high power lasers consisting of an attenuator for high powers, an imaging lens system and a camera system. The measurement of very small laser beams with diameters of less than micrometers is possible despite often high laser powers.