The beam profiling cameras BladeCam2-HR and BladeCam2-XHR combine an extremely compact design (housing depth of only 12.84 mm) with a very high resolution.
Laser Beam Profiling and M² measurement
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Laser Beam Profiling and M² measurement
The quality of the radiation is often referred to in material processing and measurement technology. Depending on the application, the quality is determined by the temporal and local stability of the output power, the width of the frequency spectrum, the temporal and local coherence, and the magnitude of the beam divergence, which is related to the extent to which the radiation can be focused.
The scanning system BeamR with rotating slots for the measurement of lasers with diameters of 0.5 microns to about 3 mm.
Based on the patented multi plane scanning technology the scanning system the BeamMap allows the measurement of focal position, beam diameter (according to ISO 11146), divergence and the M2 factor of different focussed cw or qcw laser beams in real time.
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This laser beam profiler features a CMOS sensor that guarantees frame rates of up to 60 Hz with high dynamics and is suitable for large beam diameters up to 11 mm.
The beam analysis camera WinCamD-IR-BB with integrated microbolometer array enables analyzes on long-wave lasers in the range of 2 μm to 16 μm.
This Laser Beam Profiler from DataRay is equipped with a CQD sensor and offers a spectral response in the SWIR range of 400 - 1700 nm with resolutions up to 1920 x 1080 pixel.
DataRay's ILM system is used for beam profile monitoring of high power lasers consisting of an attenuator for high powers, an imaging lens system and a camera system. The measurement of very small laser beams with diameters of less than micrometers is possible despite often high laser powers.
