Laser Beam Profiling and M² measurement
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Laser Beam Profiling and M² measurement

The quality of the radiation is often referred to in material processing and measurement technology. Depending on the application, the quality is determined by the temporal and local stability of the output power, the width of the frequency spectrum, the temporal and local coherence, and the magnitude of the beam divergence, which is related to the extent to which the radiation can be focused.



This Laser Beam Profiler from DataRay is equipped with a CQD sensor and offers a spectral response in the SWIR range of 400 - 1700 nm with resolutions up to 1920 x 1080 pixel.

This Laser Beam Profiler from DataRay is equipped with a CQD sensor and offers a spectral response in the SWIR range of 350 - 2000 nm with resolutions up to 1920 x 1080 pixel.