Description

High‑accuracy CMOS Shack‑Hartmann wavefront sensor for CW and pulsed lasers

The WaveCamD CMOS Shack‑Hartmann Wavefront Sensor is engineered for precise, real‑time wavefront characterization of continuous‑wave and pulsed laser sources. Its 9 × 9 mm AR‑coated microlens array with 60 × 60 lenslets and 150 µm pitch provides high spatial resolution and excellent sensitivity.

With a wavefront accuracy of λ/30 and a sensitivity of λ/100, the WaveCamD supports both zonal (numerical) and modal (Zernike) wavefront reconstruction methods. A high‑resolution 4.2 MP CMOS sensor, combined with a global shutter and TTL triggering, enables reliable single‑shot measurements for dynamic laser systems.

Advanced capabilities such as HyperCal™ dynamic noise and baseline correction, MagND™ magnetic neutral density filters, and USB 3.0 port‑powered operation make the WaveCamD a compact and efficient solution for research, industrial, and optical system diagnostics.

Key Features

• Spectral range: 355 – 1150 nm
• 9 × 9 mm AR‑coated microlens array
• 60 × 60 lenslets, 150 µm pitch, 5.2 mm focal length
• λ/30 wavefront accuracy, λ/100 sensitivity
• Zonal (numerical) and modal (Zernike) reconstruction
• 5.5 µm pixels, 4.2 MP CMOS sensor
• USB 3.0, port‑powered
• HyperCal™ dynamic noise and baseline correction
• MagND™ stackable magnetic ND filters or C‑mount filters
• 2,500:1 signal‑to‑RMS noise ratio
• Global shutter with TTL trigger
• Electronic auto‑shutter: 85 µs to 2 s (44 dB)
• 12‑bit ADC
• Compatible with DataRay LaserLink (HTTP communication)

Example Applications

• One‑shot wavefront measurements
• Laser beam collimation
• Real‑time beam alignment
• Optical aberration characterization