Acuros eSWIR-Camera VGA

Acuros VIS-SWIR-Camera VGA
  • Acuros VIS-SWIR-Camera VGA
  • Acuros VIS-SWIR-Camera VGA
  • Acuros VIS-SWIR-Camera VGA
  • Acuros VIS-SWIR-Camera VGA

Reference number: SWR-Acuros-0640-XXXX-002/4

The Acuros eSWIR VGA series from SWIR Vision Systems deliver crisp images in the range from 400 to 2100 nm. The cameras are designated EAR-99 requiring no license for export.


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Cameras with CQD™ technology for VIS-SWIR range

The Acuros series eSWIR cameras from SWIR Vision Systems open up a new class of cameras in the short-wave infrared range. The unique Quantum Dot technology is capable of extending the range of a single detector to cover the visible range starting from 400 nm up to 2100 nm in the extended SWIR region. 

CQD sensors are manufactured by depositing quantum dot semiconductor crystals directly on the surface of the silicon wafer.
The resulting CQD photodiode array thus enables: 

  • high resolution
  • small pixel pitch
  • high spectral bandwidth
  • low noise
  • low crosstalk between pixels

The CQD sensor technology is scalable to wafer size, which opens up the potential for very cost-effective solutions in high-volume applications.


Sensor-Specifications Other Specifications
Sensor AcurosTM CQDTM Sensor Operating Temperature -20 °C bis +55 °C
Temperature stabilization 1 Stage, thermoelectric Power Consumption 6.5 W
Sensor Array Format 640 x 512 Pixel Operating Voltage 6 - 16 V DC
Resolution 0.33 Megapixel Regulatory Compliance CE-mark
Spektraler Range 400 - 2100 nm Dimensions 6.1 x 6.1 x 9.7 mm (C-Mount Frontplate)
Array Dimension 9.6 x 7.7 mm, 12.3 mm diagonal Weight 508 g (C-Mount Frontplate)
Pixel Pitch 15 µm x 15µm Lens Mount C-Mount, M42*
Max. Framerate,10 Bit 380 fps Power Connector Hirose 12 Pin, HR10A-10R-12PB
Max. Framerate, 14 Bit 190 fps Data Interface USB3 Vision, GigE Vision
Pixel Operability typ. 99.5% GenICam Compliance Yes
Bit Depth 8, 10, 12, 14 bit (selectable) Software and User Interface Pleora eBus SDK, Windows GUI
Shutter Global Shutter
Trigger Extern TTL via BNC
Integration Time 10 µs - 30 ms
Dynamic Range 70 dB typ.
ROI-Selection Array Centered
Binning 2x2, 4x4
Non-Uniformity Correction 2-Point NUC
Temporal Dark Noise <210 e- rms typ.
Quanteneffizienz s. QE-Curve in Datasheet

* M42 (C-Mount flange-back distance)

Fields of application:

  • Industrial image processing
  • Semiconductor Inspection
  • Surveillance
  • hyperspectral imaging
  • Medical imaging processes