Inspection & Production
In semiconductor production from ingot to finished component, short-wave "SWIR imaging" is a valuable tool for detecting defects and impurities. But also in electronics manufacturing, infrared imaging from the shortwave to the thermal infrared range offers opportunities to ensure higher quality and product lifetime.
Since silicon becomes transparent from wavelengths of approx. 1200 nm, the SWIR range allows impurities and defects to be detected and sorted out at an early stage in all steps of the production chain of solar and semiconductor components. This guarantees high production efficiency and low reject rates. In electronics manufacturing and mechanical engineering, thermographic cameras can be used to identify and localize weak points or hot spots. These can lead to failures due to poor contacting or material fatigue in later use. The short-wave IR range is particularly suitable for high-temperature applications above 300 °C, e.g. in glass production, since glass is transparent for this range and hollow bodies can therefore be inspected on both the inside and outside.
Further interesting applications for infrared imaging are the thermographic inspection of industrial furnaces and crucibles. Thermography allows weak points to be identified before damage or prolonged operational downtime occurs. The inspection for thermal bridges to the environment provides information about possible optimization potential with regard to energy efficiency.